ABOUT ONE INNOVATIVE METHOD FOR TESTING AND LOCALIZING FAULTS OF DIGITAL DEVICES AT THE PRODUCTION STAGE

Siddikov I.M., Shirinov F.Sh., Kamolov A.F.

Abstract

The process of test diagnostics of digital devices at the production stage is discussed. To localize faults identified during the diagnostic process, an innovative method of reference tests is proposed.

Keywords:

: Test diagnostics of digital devices, fault localization, sequence of control tests, reference test, reference state.


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References


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